ANGSTROM SUN
Angstrom Sun Technologies Inc. is a privately held company, headquartered in Boston, USA. The focus of company is to provide a series of cost-effective optical solutions for characterizing thin film thickness, thick coating thickness, their optical properties (refractive index N and extinction coefficient K), surface and interface behavior, alloy concentrations and their uniformities across surface.
SR-AND-FILM-THICKNESS-MEASUREMENT-TOOLS
The SR series of spectroscopic reflectometers are low cost and easy to use tools. By measuring reflection spectra (at normal incidence in most cases) the film properties can be modelled using TFProbe software. If fast, routine, daily measurements are needed on known films or on a stack of simple films in a low budget case, then the SR series is a good choice.
ELLIPSOMETER-MICROSPECTROPHOTOMETER-SE-MS
It offers a solution for working on ultra-thin films with ellipsometry and also on small micrometer areas with microreflectometry, a unique setup combining ellipsometers and microspectrophotometers. TFProbe version 3.3 software will handle both measurements and analysis. For some applications, such as MEMS features or semiconductor product wafers, a small probing spot is desired.
Budget request
INFRARED-SPECTROSCOPIC-ELLIPSOMETER-IRSE
Spectroscopic ellipsometry (SE) is a widely used optical technique to characterize a wide range of materials including bulk materials, thin films, coatings, and layers both on the surface and embedded within the material. It provides valuable information about the optical properties of materials by analyzing the change in polarization state of light reflected or transmitted through the sample.
SPECTROSCOPIC-ELLIPSOMETER-DUV-VIS-NIR
The spectroscopic ellipsometer can be configured to cover a wide range of wavelengths from DUV to NIR. The DUV range is useful for measuring ultra-thin films, such as the nanometer thickness range. An example is the native oxide on the silicon wafer, which is typically only 1 to 2 nm thick. The deep UV spectroscopic ellipsometer is also essential when the user needs to measure band gaps of many materials.
SPECTROSCOPIC-ELLIPSOMETER-SE-SOLAR
The SE-Solar spectroscopic ellipsometer is designed for photovoltaic (PV) applications. It can be configured to cover the DUV to NIR range with a manual goniometer for incidence angle changes in 5-degree intervals or an automatic goniometer with 0.001-degree resolution. The array-based sensing configuration gives the user a fast measurement, in just seconds for each data point.
Budget request
SPECTROSCOPIC-ELLIPSOMETER-WITH-AUTOMATION
Spectroscopic ellipsometry (SE) is a well-established optical technique for the characterization of bulk materials, thin films, coatings, both surface and embedded, in a non-destructive and non-contact manner. For quality control of routine and manufacturing processes, an automatic cassette handler is essential. We have developed a low-cost solution.
TFPROBE-ELLIPSOMETER-FOR-EDUCATION-ESE
We are pleased to introduce TFProbe eSE educational version for universities, startups and R&D users. It is an affordable and authentic spectroscopic tool. It comes with advanced TFProbe 3.3 software for system configuration, data acquisition, simulation and regression. Different user login levels allow scientists and engineers to play with complicated layer stacks, isotropic/anisotropic, superlattices, inhomogeneous.
ECONOMICAL-MICROSPECTROPHOTOMETER-EMSP
We present a low-cost and economical micropsectophotometer eMSP toolkit for micron region spectrum and film thickness measurement, it has the same wavelength coverage as regular/standard micropsectophotometers, using the same TFProbe software for data acquisition, simulation, modeling and more. Its unique design ensures universities and small startups spend less money.
MICROSPECTROPHOTOMETER-MSP-DUV-VIS-NIR
Microspectrophotometer is used to characterize the optical properties of thin films and thick coatings in an area of micron region. Microspectrophotometer is also called microreflectometer, microspectrometer, microphotometer, microspectroscopic photometer, etc. With unique design from Angstrom professionals, user can enjoy digital imaging capability in microspectrophotometers (MSP series).
SRM-FILM-THICKNESS-MAPPING-TOOLS
When you need information about the uniformity of processed thin film, our SRM series mapping tool is for you. Spectroscopic Reflectometer (SRM) mapping tool is based on reflectometry technique and has the same working principle as spectroscopic reflectometer. SRM series allows you to map film thickness and refractive index of up to 5 layers. There is no need to worry about complicated equipment as SRM tool is easy to set up and operate.
SBudget request
DUV-VIS-NIR-LIGHT-SOURCE-DHL-3020
Angstrom Sun Technologies Inc. introduced a high-performance DUV-Vis-NIR light source for photometry and ellipsometry applications. This light source covers a wavelength range of 190 to 2500 nm, with remote control capability from a computer program using TTL level signals. The dual-lamp design offers balanced intensity output. The built-in timer provides convenience for replacing lamps during their lifetime.